ENGINEERING METROLOGY AND MEASUREMENTS Paperback – 15 October 2013

Good comprehensive book. Chapters give u a clear and crisp idea. This book is far better than RK Jain and preferable for GATE.

Recommended for engineering students

Good book explained everything in simple understandable way...book quality also good..

easy to understood and helpful for beginners

Very very good for diploma students

The media could not be loaded. Book is very good.But I don't know how does the seller sells a Specimen Copy?

Good book for who study

Jab Maine book ka description padha tab 676 pages bataye Gaye lekin mujhe 520 pages Ki book mili.yahi problem 2 baar hui. Jab maine pucha ki ye book itne pages ki hi aati hai ya amazon ki taraf se description me galti se likh Diya Gaya hai. Tab 7 din baad jab quality department valo ne mujhe kahaa Ki yeh book 520 pages Ki hi aati hai. Us din se book ke description main 520 pages bataye Gaye lekin after 1 month 676 pages bataaye jaa rahe the. What is this?

There's two authors of the book with equal prominence - but L Krishnamurthy appears to have been omitted by Amazon.Low priced for a textbook from Oxford University Press (India), and well printed in the main, with plenty of good line diagrams. Unfortunately the photographic images are often far too dark, and their mid-tones should have been lifted in Photoshop. Most are passable, but some are so dark they serve little purpose.The text seems to cover the field well, and it's a very wide field; but I'm not really qualified to comment, as I'm a retired electrical engineer, and bought it for the section on gauge blocks and optical flats. Whilst published recently, 2013, some aspects strike me as being from an earlier period, or perhaps from the (old) lecture notes of the two authors. This is a field which is advancing very quickly, and I was surprised to find that laser scan micrometry (e.g. from Mitutoyo) doesn't seem to be covered, and yet appears to be a mature method of gauging for production. On the other hand, there's a good section on nanometrology, and this introduces many modern techniques.For my purposes it was a good purchase, and has certainly widened my knowledge.

Good solid treatment of metrology principles and then great detail on the most common measurement instruments used in manufacturing engineering. As a lecturer I'm particularly impressed with the quality of teaching slides and worked examples available on-line. Very well produced and thought out publication.